第三代
半导体测试家族
Third generation semiconductor testing family
分类
QT-3104 QG gate charge test
QT-3104 QG meets the tiny QG value test of SiC devices.
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Support double DIE |
Overload and undervoltage protection |
High precision testing |
Support extension |
| Model | QT-3104 QG |
| Product Advantages | Meets the tiny QG value test of SiC devices |
| Key Features | ? Test capability: 200A/150V 150A/1000V |
Recommend推荐产品
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中国广东省佛山市南海国家高新区新光源产业基地光明大道16号 |
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0757 83207313 (销售) |
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0757 83208786 (销售) |
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[email protected] |
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