麦当劳奶昔,t20天正建筑V5.0,西沙群岛旅游的最佳时间

搜索

语言

第三代

半导体测试家族

Third generation semiconductor testing family

首页产品中心 Test System Discrete devices high-speed testing system

分类

QT-6000 Discrete Device High-Speed Test System

QT-6000 discrete device high-speed testing machine is suitable for testing small and medium-power diodes, transistors, field effect transistors and other products and wafers. It can expand built-in capacitance testing (DC+CAP), EAS, VC, pA modules, as well as external LCR (ultra high precision capacitance testing), Scanbox, etc. The machine can be used for FT mass production testing or laboratory testing.

Suspended power supply

Four quadrant circuit

High speed test

Supports multiple extensions

Type

QT-6000

Advantages

? QT-6000 discrete device high-speed testing machine has the performance advantages of high testing accuracy, fast testing speed, good stability, high reliability and strong anti-interference ability.
? Adopting four-quadrant circuit, the device under test can be protected very well.
? Adopting suspended power supply and fully symmetrical structure.
? High-speed testing meets the requirements of handler above UPH56K.

Main Features

? High speed test, UPH>40K
? One-to-two can achieve 100% FT+QA parallel testing
? Advanced capacitor high-speed test solution to achieve CAP+DC same-station testing
? Built-in UIS test solution to achieve DC+UIS same-station testing

? LCR precision capacitance test, the minimum test capacitance value is 100fF

? Voltage/current (optional): 1200V/600V, 30A/ 10A/3A.

Testing standards检测标准

Recommend推荐产品

	中国广东省佛山市南海国家高新区新光源产业基地光明大道16号
	0757 83207313 (销售)
	0757 83208786 (销售)
	[email protected]

Test System

Handler

Laser Mark

Vision

关注我们