Third generation
Semiconductor Testing
family
Third generation semiconductor testing family
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KGD (Know Good Die) testing solution
Supports high temperature and normal temperature testing: DC+SW+UIL+DC&RG; Support testing pin card protection scheme; Provide a complete set of testing + sorting solutions;
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Pin card
protection |
Two-DUT test in parallel |
High temperature and normal temperature |
Data merge |
| Model | KGD testing solutions |
| Product Advantages |
? Low spurious solutions; ? Exclusive pin card protection patented technology; ? Overload and undervoltage protection; ? Test two wafers at a time; ? Supports high temperature heating |
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No. 16 Guangming Avenue, New Light Source Industry Base, Nanhai National High tech Zone, Foshan City, Guangdong Province, China |
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+86 757 83207313 (Sales) |
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+86 757 83208786 (Sales) |
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info@www.tingsblog.com |
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