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QT-8400 power device multi-site test system
Explore the infinite possibilities of third-generation transistors

test host

GaN Test Kit

Power Device Test Kit

QT-8400 is composed of test host and test station Test Kit,
There are two types of Test Kit: Power Device Test Kit & GaN Test Kit.

Test Kit
Can be selected according to needs
  • Power Device Test Kit

    Power Device Test Kit for CP testing needs such as MOSFET/SIC, diodes, transistors, etc.

  • GaN Test Kit

    GaN Test Kit for Gallium Nitride testing needs.

105cm
Standing keyboard height
75cm
Sitting keyboard height
Sign design
Stand & sit
quick switch
Heart-touching
user experience

Based on the ergonomic design, the 8400 main case is designed for different environments such as design companies, laboratories, and packaging and testing factories to meet the user's keyboard operation needs in different standing and sitting postures. We have designed a unique guide line. , allowing users to quickly find the recommended keyboard height when standing or sitting, and can also fine-tune it according to personal height differences, which greatly improves operating comfort and efficiency.

* Patent applied

Sign design
Stand & sit
quick switch
Heart-touching
User experience

Based on the ergonomic design, the 8400 main case is designed for different environments such as design companies, laboratories, and packaging and testing factories to meet the user's keyboard operation needs in different standing and sitting postures. We have designed a unique guide line. , allowing users to quickly find the recommended keyboard height when standing or sitting, and can also fine-tune it according to personal height differences, which greatly improves operating comfort and efficiency.

* Patent applied

105cm
Standing keyboard height
75cm
Sitting keyboard height
Parallel testing
doubles efficiency
Supports 2/4/8/16 Site parallel testing to meet customer needs for higher testing efficiency.
Testing needs,
comprehensive coverage
QT-8400 platform provides 20A/100A, 1KV/2KV multi-site test solutions, support extended high voltage/DC modules, up to 8KV, 2000A, support extended avalanche, RGCG, dynamic RDson and other dynamic parameter test modules, to meet the third generation of semiconductor testing needs

QT-8400 GaN

QT-8400 D

Test Range

Dedicated to testing dynamic and static electrical parameters of gallium nitride

Test Range

Dedicated to MOSFET/SIC, diodes, transistors, IGBT and other CP testing.

Parameter index

Floating V/I Source
Voltage 1KV/2KV
20A/100A;

Parameter index

Floating V/I Source
Voltage 1KV/2KV/3KV
20A/100A/200A

Number of parallel tests

2/4/8/16 Site

Number of parallel tests

2/4/8/16 Site

Extensible dynamic modules

LCR test module (CG)
Dynamic RDSON module (supports hard and soft cutting)

Extensible dynamic modules

Avalanche test module (UIS, EAS)
LCR test module (RG, CG)

Expandable high voltage/DC module

Expandable up to 8KV, 2KA

Expandable high voltage/DC module

Expandable up to 8KV, 2KA

Precise measurement

The GaN Test Kit has a built-in precision measurement circuit to achieve accurate measurements at the nA level and mΩ level.

Precise measurement

The Power Device Test Kit has a built-in precision measurement circuit to achieve nA-level and mΩ-level accurate measurements.

Flexible allocation
of board resources
Our equipment adopts a pluggable board architecture, allowing you to flexibly match boards according to your needs, thereby achieving precise control of testing costs.
Comprehensive functions to
meet various needs
The test host boards are all four-quadrant V/I sources, equipped with AWG and oscilloscope, and have comprehensive functions to meet various scanning test needs such as I-V curves.

Built-in oscilloscope graph

AWG Editor
PTS OS is intuitive and easy to use,
Designed for testing & production
We have fully optimized the QT-8400 PTS OS software interface to improve practicality, aesthetics and ease of use. Greatly improve the efficiency of test development, production and debugging and calibration, making it easy for users to operate efficiently.

* Patent applied

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